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When it comes to quality, we don’t just test – we innovate.

Take as an example a high temperature reverse bias (HTRB) tester. It is essential for verifying the long-term reliability of semiconductor components such as diodes, transistors, MOSFETs, and IGBTs under extreme operating conditions – high voltage and high temperature.

Reliability testing is a critical step in both new product approval and daily production quality checks. At Diotec, we take this one step further:

• We design and build our own test equipment, taylor-made for the parts we do
• Diotec's own components are built into the control circuits, being a "real life testing" under very harsh conditions

Here’s a look at some of the Diotec parts embedded in the HTRB tester’s main control board:

• 1N4148WS - Small Signal Diode, SOD-323F, 100V, 0.15A, 150°C
• SM4007 - Diode, Melf, 1000V, 1A, 175°C
• BZT52B15 - Zener, SOD-123F, 15V, 0.5W, ±2%
• SL1M - Diode, SOD-123FL, 1000V, 1A, 150°C
• ZMD15B - Zener, MiniMelf, 15V, 1W, ±2%
• MM3Z4B7 - Zener, SOD-323F, 4.7V, 0.3W, ±5%, AEC-Q101
• Z1SMA6.8 - Zener, SMA, 6.8V, 1.5W, ±5%
• BC807-25 - Bipolar Transistor, SOT-23, 45V, 800mA, PNP, 0.31W, 150°C 
• BC817-25  - Bipolar Transistor, SOT-23, 45V, 800mA, NPN, 0.31W, 150°C
• BCM847BS - Bipolar Transistor, SOT-363, 45V, 100mA, NPN, 0.25W, 150°C
• DI78L12UAB  - Voltage Regulator, SOT-89, 35V, 11.5V, 12.5V, 125°C, 6mA

Because when we say “tested for reliability,” we mean it - with our technology at every level.